Language-integrated provenance by trace analysis

Summary

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Authors: Stefan Fehrenbach, James Cheney

Journal title: Proceedings of the 17th ACM SIGPLAN International Symposium on Database Programming Languages - DBPL 2019

Journal publisher: ACM Press

Published year: 2019

Published pages: 74-84

DOI identifier: 10.1145/3315507.3330198

ISBN: 9781-450367189