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Authors: B. J. Offrein, J. Geler-Kremer, J. Weiss, R. Dangel, P. Stark, A. Sharma, Stefan Abel, F. Horst
Journal title: 2020 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2020
Published pages: 7.4.1-7.4.4
DOI identifier: 10.1109/iedm13553.2020.9371915
ISBN: 978-1-7281-8888-1