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Authors: Ivan Rodriguez, Leonidas Kosmidis, Olivier Notebaert, Francisco J. Cazorla, David Steenari
Journal title: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2020
Published pages: 1718-1719
DOI identifier: 10.23919/date48585.2020.9116538
ISBN: 978-3-9819263-4-7
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