Learning optimal wavefront shaping for multi-channel imaging

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Authors: Elias Nehme, Boris Ferdman, Lucien Weiss, Tal Naor, Daniel Freedman, Tomer Michaeli, Yoav Shechtman

Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence

Journal number: vol. 43, no. 7, pp. 2179-2192

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 1-1

DOI identifier: 10.1109/tpami.2021.3076873

ISSN: 0162-8828