Machine Learning Testing: Survey, Landscapes and Horizons

Summary

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Authors: Jie M. Zhang, Mark Harman, Lei Ma, Yang Liu

Journal title: IEEE Transactions on Software Engineering

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 1-1

DOI identifier: 10.1109/tse.2019.2962027

ISSN: 0098-5589