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Authors: K. Bojarczuk; N. Gucevska; S. Lucas; I. Dvortsova; M. Harman; E. Meijer; S. Sapora; J. George; M. Lomeli; R. Rojas
Journal title: ESEM '21: Proceedings of the 15th ACM / IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)
Journal number: Article No 2 Pages 1–10
Journal publisher: ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)
Published year: 2021
DOI identifier: 10.1145/3475716.3484196