Gate-level modelling of NBTI-induced delays under process variations

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Authors: Thiago Copetti, Guilherme Medeiros, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar

Journal title: 2016 17th Latin-American Test Symposium (LATS)

Journal publisher: IEEE

Published year: 2016

Published pages: 75-80

DOI identifier: 10.1109/LATW.2016.7483343

ISBN: 978-1-5090-1331-9