A Synthesis-Agnostic Behavioral Fault Model for High Gate-Level Fault Coverage

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Authors: Anton Karputkin, Jaan Raik

Journal title: Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: Research Publishing Services

Published year: 2016

Published pages: 1124-1127

DOI identifier: 10.3850/9783981537079_0260

ISBN: 978-3-9815370-7-9