Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Jenihhin, Maksim; Squillero, Giovanni; Copetti, Thiago Santos; Tihhomirov, Valentin; Kostin, Sergei; Gaudesi, Marco; Vargas, Fabian; Raik, Jaan; Sonza Reorda, Matteo; Bolzani Poehls, Leticia; Ubar, Raimund; Medeiros, Guilherme Cardoso

Journal title: Journal of Electronic Testing-Theory and Applications (JETTA)

Journal publisher: SPRINGER

Published year: 2016