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Authors: Heinz Riener, Goerschwin Fey
Journal title: 2016 1st IEEE International Verification and Security Workshop (IVSW)
Journal publisher: IEEE
Published year: 2016
Published pages: 1-6
DOI identifier: 10.1109/IVSW.2016.7566605
ISBN: 978-1-5090-1141-4
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