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Authors: Hans G. Kerkhoff, Ghazanfar Ali, Jinbo Wan, Ahmed Ibrahim, Jerrin Pathrose
Journal title: 2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-6
DOI identifier: 10.1109/VLSI-SoC.2017.8203464
ISBN: 978-1-5386-2880-5