An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability

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Authors: Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Ibrahim

Journal title: 2017 International Test Conference in Asia (ITC-Asia)

Journal publisher: IEEE

Published year: 2017

Published pages: 65-70

DOI identifier: 10.1109/ITC-ASIA.2017.8097113

ISBN: 978-1-5386-3051-8