A dependable AMR sensor system for automotive applications

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Authors: Andreina Zambrano, Hans G. Kerkhoff

Journal title: 2017 International Test Conference in Asia (ITC-Asia)

Journal publisher: IEEE

Published year: 2017

Published pages: 59-64

DOI identifier: 10.1109/ITC-ASIA.2017.8097112

ISBN: 978-1-5386-3051-8