Structured scan patterns retargeting for dynamic instruments access

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Authors: Ahmed Ibrahim, Hans G. Kerkhoff

Journal title: 2017 IEEE 35th VLSI Test Symposium (VTS)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-6

DOI identifier: 10.1109/VTS.2017.7928955

ISBN: 978-1-5090-4482-5