A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687

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Authors: Ahmed Ibrahim, Hans G. Kerkhoff

Journal title: 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-2

DOI identifier: 10.1109/IOLTS.2017.8046166

ISBN: 978-1-5386-0352-9