High-level test generation for processing elements in many-core systems

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Authors: Adeboye Stephen Oyeniran, Raimund Ubar, Siavoosh Payandeh Azad, Jaan Raik

Journal title: 2017 12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-8

DOI identifier: 10.1109/ReCoSoC.2017.8016156

ISBN: 978-1-5386-3344-1