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Authors: Konstantin Shibin, Sergei Devadze, Artur Jutman, Martin Grabmann, Robin Pricken
Journal title: IEEE Design & Test
Journal number: 34/6
Journal publisher: IEEE Computer Society
Published year: 2017
Published pages: 27-35
DOI identifier: 10.1109/MDAT.2017.2750902
ISSN: 2168-2356