Run-time reconfigurable instruments for advanced board-level testing

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Authors: Igor Aleksejev, Artur Jutman, Sergei Devadze

Journal title: 2016 IEEE AUTOTESTCON

Journal publisher: IEEE

Published year: 2016

Published pages: 1-8

DOI identifier: 10.1109/AUTEST.2016.7589627

ISBN: 978-1-5090-0790-5