Embedded instrumentation toolbox for screening marginal defects and outliers for production

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Authors: Sergei Odintsov, Artur Jutman, Sergei Devadze, Igor Aleksejev

Journal title: 2017 IEEE AUTOTESTCON

Journal publisher: IEEE

Published year: 2017

Published pages: 1-9

DOI identifier: 10.1109/AUTEST.2017.8080516

ISBN: 978-1-5090-4922-6