Marginal PCB assembly defect detection on DDR3/4 memory bus

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Authors: Sergei Odintsov, Artur Jutman, Sergei Devadze

Journal title: 2017 IEEE International Test Conference (ITC)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-10

DOI identifier: 10.1109/TEST.2017.8242070

ISBN: 978-1-5386-3413-4