Total Deep Variation for Linear Inverse Problems

Summary

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Authors: Erich Kobler, Alexander Effland, Karl Kunisch, Thomas Pock

Journal title: IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

Journal publisher: IEEE

Published year: 2020

Published pages: 7546-7555

DOI identifier: 10.1109/cvpr42600.2020.00757