Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects

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Authors: Tino Flenker, Jan Malburg, Gorschwin Fey, Serhiy Avramenko, Massimo Violante, Matteo Sonza Reorda

Journal title: 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

Journal publisher: IEEE

Published year: 2017

Published pages: 533-538

DOI identifier: 10.1109/ISVLSI.2017.99

ISBN: 978-1-5090-6762-6