Gate-Level Modelling of NBTI-Induced Delays Under Process Variations

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Copetti, Thiago; Medeiros, Guilherme; Poehls, Leticia; Vargas, Fabian; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan (Tallinn UT)

Journal publisher: IEEE Computer Society Press

Published year: 2016

Published pages: 75-80