Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits

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Authors: Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros

Journal title: Journal of Electronic Testing

Journal number: 32/3

Journal publisher: Kluwer Academic Publishers

Published year: 2016

Published pages: 273-289

DOI identifier: 10.1007/s10836-016-5589-x

ISSN: 0923-8174