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Authors: Niklas Krafczyk, Heinz Riener, Goerschwin Fey
Journal title: 2016 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
Journal publisher: IEEE
Published year: 2016
Published pages: 1-6
DOI identifier: 10.1109/VLSI-SoC.2016.7753559
ISBN: 978-1-5090-3561-8