Towards an automated and reusable in-field self-test solution for MPSoCs

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Authors: Ahmed Ibrahim, Hans G. Kerkhoff

Journal title: 2016 28th International Conference on Microelectronics (ICM)

Journal publisher: IEEE

Published year: 2016

Published pages: 249-252

DOI identifier: 10.1109/ICM.2016.7847862

ISBN: 978-1-5090-5721-4