Efficient utilization of hierarchical iJTAG networks for interrupts management

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Authors: Ahmed Ibrahim, Hans G. Kerkhoff

Journal title: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Journal publisher: IEEE

Published year: 2016

Published pages: 97-102

DOI identifier: 10.1109/DFT.2016.7684077

ISBN: 978-1-5090-3623-3