Thermal issues in test: An overview of the significant aspects and industrial practice

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Authors: J. Alt, P. Bernardi, A. Bosio, R. Cantoro, H. Kerkhoff, A. Leininger, W. Molzer, A. Motta, C. Pacha, A. Pagani, A. Rohani, R. Strasser

Journal title: 2016 IEEE 34th VLSI Test Symposium (VTS)

Journal publisher: IEEE

Published year: 2016

Published pages: 1-4

DOI identifier: 10.1109/VTS.2016.7477278

ISBN: 978-1-4673-8454-4