Simulating NBTI Degradation in Arbitrary Stressed Analog/Mixed-Signal Environments

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Authors: Jinbo Wan, Hans Kerkhoff, Jaap Bisschop

Journal title: IEEE Transactions on Nanotechnology

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2016

Published pages: 1-1

DOI identifier: 10.1109/TNANO.2015.2505092

ISSN: 1536-125X