New Fault Models and Self-Test Generation for Microprocessors Using High-Level Decision Diagrams

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Authors: Artjom Jasnetski, Jaan Raik, Anton Tsertov, Raimund Ubar

Journal title: 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Journal publisher: IEEE

Published year: 2015

Published pages: 251-254

DOI identifier: 10.1109/DDECS.2015.56

ISBN: 978-1-4799-6780-3