Static Analysis of Endian Portability by Abstract Interpretation

Summary

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Authors: David Delmas, Abdelraouf Ouadjaout, Antoine Miné

Journal title: Static Analysis - 28th International Symposium, SAS 2021

Journal number: 1

Journal publisher: Springer

Published year: 2021

Published pages: 102-123

DOI identifier: 10.1007/978-3-030-88806-0_5