Magnetic Field Resilience of Three-Dimensional Transmons with Thin-Film Al/AlOx/Al Josephson Junctions Approaching 1 T

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Authors: J. Krause, C. Dickel, E. Vaal, M. Vielmetter, J. Feng, R. Bounds, G. Catelani, J. M. Fink, Yoichi Ando

Journal title: Physical Review Applied

Journal number: 17/3

Journal publisher: American Physical Society

Published year: 2022

Published pages: 034032

DOI identifier: 10.1103/physrevapplied.17.034032

ISSN: 2331-7019