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Authors: Abraham Chan, Stefan Winter, Habib Saissi, Karthik Pattabiraman, Neeraj Suri
Journal title: 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST)
Journal number: Annual
Journal publisher: IEEE
Published year: 2017
Published pages: 184-195
DOI identifier: 10.1109/ICST.2017.24
ISBN: 978-1-5090-6031-3