Membrane-Based Scanning Force Microscopy

Summary

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Authors: David Hälg, Thomas Gisler, Yeghishe Tsaturyan, Letizia Catalini, Urs Grob, Marc-Dominik Krass, Martin Héritier, Hinrich Mattiat, Ann-Katrin Thamm, Romana Schirhagl, Eric C. Langman, Albert Schliesser, Christian L. Degen, Alexander Eichler

Journal title: Physical Review Applied

Journal number: 15/2

Journal publisher: American Physical Society

Published year: 2021

DOI identifier: 10.1103/physrevapplied.15.l021001

ISSN: 2331-7019