Ferroelectric Exchange Bias Affects Interfacial Electronic States.

Summary

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Authors: Gal Tuvia; Yiftach Frenkel; P. K. Rout; Itai Silber; Beena Kalisky; Yoram Dagan

Journal title: ADVANCED MATERIALS

Journal number: 3

Journal publisher: United Nations Industrial Developement Organization

Published year: 2020

DOI identifier: 10.1002/adma.202000216

ISSN: 0935-9648