Summary
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Authors: Raymundo de Amorim 1 , Nicolas Barbot 2, 1, 3 , Romain Siragusa 1 , Christophe Trehoult 1 , Laurent Lyannaz 1 , Etienne Perret 1
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/rfid-ta54958.2022.9924110