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Authors: Mykhaylo Andriluka, Umar Iqbal, Eldar Insafutdinov, Leonid Pishchulin, Anton Milan, Juergen Gall, Bernt Schiele
Journal title: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition
Journal publisher: IEEE
Published year: 2018
Published pages: 5167-5176
DOI identifier: 10.1109/cvpr.2018.00542
ISBN: 978-1-5386-6420-9
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