Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO 2 Based Memristors

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Authors: Robert Eilhardt, Alexander Zintler, Oscar Recalde, Déspina Nasiou, Stefan Petzold, Lambert Alff, Leopoldo Molina-Luna

Journal title: Microscopy and Microanalysis

Journal number: 27/S1

Journal publisher: Cambridge University Press

Published year: 2021

Published pages: 1238-1239

DOI identifier: 10.1017/s1431927621004645

ISSN: 1431-9276