Random Features for Kernel Approximation: A Survey on Algorithms, Theory, and Beyond

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Authors: Fanghui Liu, Xiaolin Huang, Yudong Chen, Johan A. K. Suykens

Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 1-1

DOI identifier: 10.1109/tpami.2021.3097011

ISSN: 0162-8828