Risk evolution analysis of ship pilotage operation by an integrated model of FRAM and DBN

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Authors: Yunlong Guo, Yongxing Jin, Shenping Hu, Zaili Yang, Yongtao Xi, Bing Han

Journal title: Reliability Engineering & System Safety

Journal publisher: Elsevier BV

Published year: 2023

DOI identifier: 10.1016/j.ress.2022.108850

ISSN: 0951-8320