Offline Model Guard: Secure and Private ML on Mobile Devices

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Authors: Sebastian P. Bayerl, Tommaso Frassetto, Patrick Jauernig, Korbinian Riedhammer, Ahmad-Reza Sadeghi, Thomas Schneider, Emmanuel Stapf, Christian Weinert

Journal title: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2020

Published pages: 460-465

DOI identifier: 10.23919/date48585.2020.9116560

ISBN: 978-3-9819263-4-7