SPARCOM: Sparsity Based Super-resolution Correlation Microscopy

Summary

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Authors: Oren Solomon, Yonina C. Eldar, Maor Mutzafi, Mordechai Segev

Journal title: SIAM Journal on Imaging Sciences

Journal number: 12/1

Journal publisher: Society for Industrial and Applied Mathematics

Published year: 2019

Published pages: 392-419

DOI identifier: 10.1137/18m1174921

ISSN: 1936-4954