Symmetry-guided nonrigid registration: The case for distortion correction in multidimensional photoemission spectroscopy

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: R. Patrick Xian, Laurenz Rettig, Ralph Ernstorfer

Journal title: Ultramicroscopy

Journal number: 202

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 133-139

DOI identifier: 10.1016/j.ultramic.2019.04.004

ISSN: 0304-3991