Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach

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Authors: Chenglu Zhang, Yubin Zhang, Guilin Wu, Wenjun Liu, Ruqing Xu, Dorte Juul Jensen, Andrew Godfrey

Journal title: Journal of Applied Crystallography

Journal number: 52/5

Journal publisher: JOURNAL OF APPLIED CRYSTALLOGRAPHY

Published year: 2019

Published pages: 1119-1127

DOI identifier: 10.1107/s1600576719010562

ISSN: 1600-5767