Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications

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Authors: D. Jannis, C. Hofer, C. Gao, X. Xie, A. Béché, T.J. Pennycook, J. Verbeeck

Journal title: Ultramicroscopy

Journal number: 233

Journal publisher: Elsevier BV

Published year: 2022

Published pages: 113423

DOI identifier: 10.1016/j.ultramic.2021.113423

ISSN: 0304-3991