Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: C. Gao, C. Hofer, D. Jannis, A. Béché, J. Verbeeck, and T. J. Pennycook

Journal title: Applied Physics Letters

Journal number: 121

Journal publisher: American Institute of Physics

Published year: 2022

Published pages: 081906

DOI identifier: 10.1063/5.0101895

ISSN: 0003-6951