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Authors: V. Milo, D. Ielmini, E. Chicca
Journal title: 2017 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2017
Published pages: 11.2.1-11.2.4
DOI identifier: 10.1109/IEDM.2017.8268369
ISBN: 978-1-5386-3559-9