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Authors: Roberto Carboni, Wei Chen, Manzar Siddik, Jon Harms, Andy Lyle, Witold Kula, Gurtej Sandhu, Daniele Ielmini
Journal title: IEEE Electron Device Letters
Journal number: 39/7
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 951-954
DOI identifier: 10.1109/LED.2018.2833543
ISSN: 0741-3106