Modeling of Breakdown-Limited Endurance in Spin-Transfer Torque Magnetic Memory Under Pulsed Cycling Regime

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Authors: Roberto Carboni, Stefano Ambrogio, Wei Chen, Manzar Siddik, Jon Harms, Andy Lyle, Witold Kula, Gurtej Sandhu, Daniele Ielmini

Journal title: IEEE Transactions on Electron Devices

Journal number: 65/6

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2018

Published pages: 2470-2478

DOI identifier: 10.1109/TED.2018.2822343

ISSN: 0018-9383