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Authors: G. Pedretti, S. Bianchi, V. Milo, A. Calderoni, N. Ramaswamy, D. Ielmini
Journal title: 2017 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2017
Published pages: 28.1.1-28.1.4
DOI identifier: 10.1109/IEDM.2017.8268467
ISBN: 978-1-5386-3559-9